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International Journal of Bipolar Disorders

Table 3 Relative risk of admission using four models of event effect decay

From: The influence of life events on first and recurrent admissions in bipolar disorder

Model

Coefficient

Exp coefficient a

Log-likelihood of fitted model

p

Cumulative

.024

1.024

−308.5503

<.001

25% decay

.134

1.143

−293.5533b

<.001

50% decay

.240

1.272

−298.4862

<.001

75% decay

.452

1.572

−306.3194

<.001

  1. aExponentiated linear coefficients. bLowest absolute log-likelihood of fitted model.
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